GaN Epitaxy with PA-MBE on HF Cleaned Cobalt-silicide Buffer Layer

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Dislocation reduction in GaN film using Ga-lean GaN buffer layer and migration enhanced epitaxy

a Department of Materials Science and Engineering, National Chiao Tung University, 1001 Ta Hsueh Rd., 30010 Hsinchu, Taiwan b Department of Electronics Engineering, National Chiao Tung University, 1001 Ta Hsueh Rd., 30010 Hsinchu, Taiwan c Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA 24061, USA d Department of Electrophysics, National Chiao Tung University, 1...

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ژورنال

عنوان ژورنال: Journal of the Korea Academia-Industrial cooperation Society

سال: 2010

ISSN: 1975-4701

DOI: 10.5762/kais.2010.11.2.409